Canon WITE32 Specifications download pdf (Page 61)

WITE32 Release Notes Version 3.20

5.5 Tests and Measurements

1. The Spectral Integral SNR test does not use Load/Unload Parameters defined in the spinstand setup

when the Use Spin Stand Load/Unload Parameters option is selected in the test setup. The test

loads/unloads a head on the OD radius for measuring an unloaded head noise.

2. The Spectral Integral SNR test may give wrong results if the non-sector mode is selected, and the

Enhanced Performance Mode is set to None in the Configure | Measurement Options dialog.

3. For RWA-2550/2585 family, the SNR test might measure the Crest factor value larger the 100% when

the full size write gate and read gate are enabled.

4. The Track Profile test might crash if the File Path in the Auto ASCII Export frame (Configure |

Configure Result Processor) is empty.

5. The Track Profile test does not report any results (even –9999 values) if measurements fail.

6. In the Alternative Overwrite test signal frequencies specified in nanoseconds are interpreted as micro

inches and micro inches as nanoseconds.

7. The ATI test does not check that the Write With Retries Operation is enabled.

8. The result names for R/O Parametric test are changed to ROP_PWN and ROP_TAA instead of Pulse

Width and TAA, for differentiating them from the results of TAA and PWN tests.

9. On a fast computer, Digital Parametric measurements performed for a long acquisition length

(Maximum possible acquisition time setting in the Control | Digital Measurements dialog box) can give

a timeout error message or produce unstable results.

10. For RWA 2000 series, if a programmable differentiator is installed in slot 0 (which is used for TAA

calibration), no error message is issued. Measurement results may be distorted. In the WITE32 version

3.20 the following error message is displayed in this case: “Improper hardware connection. No filter in

the slot #0. Calibration is not possible”.

11. The 747 Comparator Error Rate test does not display any warnings if the Overwrite filter is selected.

Now it shows a message "You cannot use the Overwrite filter. The Parametric filter will be used

instead”.

12. The 747 Comparator Error Rate test does not set the selected in the 747 test (Standard Setup) Bit Cell

period for the Side Track and the Adjacent Track to the PRML chip if a PRML chip pattern is selected.

In this case both the Side Track and the Adjacent Track are written with the system Bit Cell Period

(Control | System dialog).

Note: If the Bit Cell period for the Side Track or the Adjacent Track in your product is out of the PRML chip

frequency range, an error message “System setup/configuration error. Chip data rate out of range“ pops up in

WITE32 version 3.20.

13. The Popcorn test intermittently produces wrong results when executed just after the first device start.

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Canon WITE32 Specifications Page 61